| ▶ 전자기적합성 |
| KS C 9811:2019 |
산업, 과학, 의료용 기기 (ISM)류 장해방지시험 방법 |
CE:150 kHz ~ 30 MHz
RE:9 kHz ~ 18 GHz |
소재지 |
| KS C 9814-1:2022 |
가정용 전기기기 및 전동기기류의 장해방지시험 |
CE:150 kHz ~ 30 MHz
RE:30 MHz ~ 1 GHz
DP:30 MHz ~ 300 MHz |
소재지 |
| KS C 9814-2:2022 |
가정용 전기기기 및 전동기기류의 내성시험 |
ESD:±30 kV
RS:80 MHz ~ 1 GHz
EFT:±1 kV
Surge:±2 kV
CS:150 kHz ~ 230 MHz
V-DIP:max 16 A (각 상당) |
소재지 |
| KS C 9832:2019 |
멀티미디어 기기 전자파 장해방지 시험방법 |
CE:150 kHz ~ 30 MHz
RE:30 MHz ~ 6 GHz |
소재지 |
| KS C 9835:2019 |
멀티미디어 기기 전자파 내성 시험 방법 |
MF:1 A/m
ESD:±8 kV
RS:80 MHz ~ 6 GHz
EFT:±1 kV
Surge:±4 kV
CS:150 kHz ~ 80 MHz
V-DIP:max 16 A (각 상당) |
소재지 |
| KN 50:2010 |
전기철도 전자파 장해방지 시험방법 |
RE:9 kHz ~ 1 GHz |
소재지 |
| KS C 9610-4-2:2017 |
전자파적합성(EMC) — 제4-2부: 시험 및 측정기술 — 정전기 방전 내성 시험 |
ESD:±30 kV |
소재지 |
| KS C 9610-4-3:2017 |
전자파적합성(EMC) — 제4-3부: 시험 및 측정기술 — 방사성 RF 전자기장 내성 시험 |
RS:80 MHz ~ 6 GHz |
소재지 |
| KS C 9610-4-4:2020 |
전자파적합성(EMC) — 제4-4부: 시험 및 측정기술 — 전기적 빠른 과도현상, 버스트 내성 시험 |
EFT:±4 kV |
소재지 |
| KS C 9610-4-5:2020 |
전자파적합성(EMC) — 제4—5부: 시험 및 측정기술 — 서지 내성 시험 |
Surge:±4 kV |
소재지 |
| KS C 9610-4-6:2020 |
전자파적합성(EMC) — 제4-6부: 시험 및 측정기술 — 전도성 RF 전자기장 내성 시험 |
CS:150 kHz ~ 230 MHz |
소재지 |
| KS C 9610-4-8:2017 |
전자파적합성(EMC) — 제4-8부: 시험 및 측정기술 — 전원 주파수 자기장 내성 시험 |
M/F:125 A/m |
소재지 |
| KS C 9610-4-11:2020 |
전자파적합성(EMC) — 제4-11부: 시험 및 측정기술 — 전압 강하, 순간 정전, 전압 변동 내성 시험 |
V-DIP:max 16 A (각 상당) |
소재지 |
| KS C 9610-6-3:2017 |
전자파적합성(EMC) —제6-3부: 일반표준 — 주거용, 상업용 및 경공업 환경에서 사용하는 기기의 전자파 방해 표준 |
CE:150 kHz ~ 30 MHz
RE:30 MHz ~ 6 GHz |
소재지 |
| KS C 9610-6-4:2022 |
전자파적합성(EMC) ― 제6-4부: 일반 표준 ― 산업 환경에서의 전자파 방출 표준 |
CE:150 kHz ~ 30 MHz
RE:30 MHz ~ 6 GHz |
소재지 |
| KS C 9040-2:2017 |
무정전전원장치(UPS) ― 제2부: 전자파적합성(EMC) 요구사항 |
CE:150 kHz ~ 30 MHz
RE:10 kHz ~ 1 GHz
ESD:±8 kV
RS:80 MHz ~ 1 GHz
EFT:±2 kV
Surge:±2 kV
CS:150 kHz ~ 230 MHz |
소재지 |
| KS C IEC 60947-1:2014 |
저압 개폐장치 및 제어장치 – 제1부: 일반 규정 |
CE:150 kHz ~ 30 MHz
RE:30 MHz ~ 6 GHz
ESD:±8 kV
RS:80 MHz ~ 3 GHz
EFT:±2 kV
Surge:±2 kV
CS:150 kHz ~ 80 MHz
V-DIP:max 16 A (각 상당) |
소재지 |
| KS C IEC 60601-1-2:2020 |
의료용 전기기기 ─ 제1-2부: 기본안전 및 필수성능에 관한 일반 요구사항 ─ 보조표준: 전자파 방해 ─ 요구사항 및 시험 |
ESD:±8 kV
RS:80 MHz ~ 3 GHz
EFT:±2 kV
Surge:±2 kV
CS:150 kHz ~ 80 MHz
M/F:3 A/m
V-DIP:max 16 A (각 상당) |
소재지 |
| KS C 9547:2020 |
일반 조명기기 —
전자파적합성(EMC) 내성 요구사항 |
ESD:±8 kV
RS:80 MHz ~ 1 GHz
EFT:±1 kV
Surge:±2 kV
CS:150 kHz ~ 80 MHz
M/F:3 A/m
V-DIP:max 16 A (각 상당) |
소재지 |
| KS C 9974-10:2020 |
아크 용접 설비 － 제10부: 전자파적합성(EMC) 요구사항 |
CE:9 kHz ~ 30 MHz
RE:30 MHz ~ 1 GHz
ESD:±8 kV
RS:80 MHz ~ 3 GHz
EFT:±2 kV
Surge:±2 kV
CS:150 kHz ~ 80 MHz
V-DIP:max 16 A (각 상당) |
소재지 |
| KS C 9610-6-1:2019 |
전자파적합성(EMC) — 제6-1부: 일반기준 — 주거용, 상업용 및 경공업 환경에서 사용하는 기기의 전자파 내성 표준 |
ESD:±8 kV
RS:80 MHz ~ 6 GHz
EFT:±2 kV
Surge:±2 kV
CS:150 kHz ~ 80 MHz
M/F:3 A/m
V-DIP:max 16 A (각 상당) |
소재지 |
| KS C 9610-6-2:2019 |
전자파적합성(EMC) — 제6-2부: 일반기준 — 산업 환경에서 사용하는 기기의 전자파 내성 표준 |
ESD:±8 kV
RS:80 MHz ~ 6 GHz
EFT:±2 kV
Surge:±2 kV
CS:150 kHz ~ 80 MHz
M/F:3 A/m
V-DIP:max 16 A (각 상당) |
소재지 |
| KS X 3125:2020 |
특정 소출력 무선기기 전자파적합성 시험방법 |
CE:9 kHz ~ 30 MHz
RE:30 MHz ~ 6 GHz.
ESD:±8 kV
RS:80 MHz ~ 6 GHz,
EFT:±1 kV
Surge:±2 kV
CS:150 kHz ~ 80 MHz,
3 V
M/F:3 A/m
V-DIP:max 16 A (각 상당) |
소재지 |
| KS X 3128:2014 |
디지털 코드 없는 전화기
전자파 적합성 시험방법 |
CE:9 kHz ~ 30 MHz
RE:30 MHz ~ 6 GHz.
ESD:±8 kV
RS:80 MHz ~ 6 GHz,
EFT:±1 kV
Surge:±2 kV
CS:150 kHz ~ 80 MHz,
3 V
M/F:3 A/m
V-DIP:max 16 A (각 상당) |
소재지 |
| KS X 3131:2014 |
생활무전기 전자파적합성 시험방법 |
CE:9 kHz ~ 30 MHz
RE:30 MHz ~ 6 GHz.
ESD:±8 kV
RS:80 MHz ~ 6 GHz,
EFT:±1 kV
Surge:±2 kV
CS:150 kHz ~ 80 MHz,
3 V
M/F:3 A/m
V-DIP:max 16 A (각 상당) |
소재지 |
| KS X 3126:2020 |
무선 데이터 통신 시스템용 특정 소출력 무선기기 전자파적합성 시험방법 |
CE:9 kHz ~ 30 MHz
RE:30 MHz ~ 6 GHz.
ESD:±8 kV
RS:80 MHz ~ 6 GHz,
EFT:±1 kV
Surge:±2 kV
CS:150 kHz ~ 80 MHz,
3 V
M/F:3 A/m
V-DIP:max 16 A (각 상당) |
소재지 |
| KN 301 489-24:2008 |
이동 통신용 무선설비의 기기에 대한 전자파 적합성 시험방법 |
CE:9 kHz ~ 30 MHz
RE:30 MHz ~ 6 GHz.
ESD:±8 kV
RS:80 MHz ~ 6 GHz
EFT:±1 kV
Surge:±2 kV
CS:150 kHz ~ 80 MHz,
3 V
M/F:3 A/m
V-DIP:max 16 A (각 상당) |
소재지 |
| KS C 3134:2014 |
체내 이식 무선 의료 기기 전자파 적합성 시험 방법 |
CE:150 kHz ~ 30 MHz
RE:30 MHz ~ 6 GHz
ESD:±8 kV
RS:80 MHz ~ 3 GHz
EFT:±1 kV
Surge:±2 kV
CS:150 kHz ~ 80 MHz
M/F:3 A/m
V-DIP:max 16 A (각 상당) |
소재지 |
| CISPR14-2:2020 |
Electromagnetic compatibility - Requirements for household appliances, electric tools and similar apparatus - Part 2: Immunity - Product family standard |
ESD:±8 kV
RS:80 MHz ~ 1 GHz
EFT:±1 kV
Surge:±2 kV
CS:150 kHz ~ 230 MHz
V-DIP:max 16 A (각 상당) |
소재지 |
| CISPR 24:2010+AMD1:2015 CSV |
Information technology equipment - Immunity characteristics - Limits and methods of measurement |
ESD:±8 kV
RS:80 MHz ~ 1 GHz
EFT:±1 kV
Surge:±4 kV
CS:150 kHz ~ 80 MHz
V-DIP:max 16 A (각 상당) |
소재지 |
| EN 55011: 2016+A1:2017 |
Industrial, scientific and medical(ISM) radio-frequency equipment-Radio disturbance characteristics- Limits and methods of measurement |
CE:150 kHz ~ 30 MHz
RE:30 MHz ~ 18 GHz |
소재지 |
| EN 55022:2010 |
Information technology equipment-radio disturbance characteristics-limit and methods of measurement |
CE:150 kHz ~ 30 MHz
RE:30 MHz ~ 6 GHz |
소재지 |
| EN 55024:2010+A1:2015 |
Information technology equipment- |
ESD:± 8 kV
RS:80 MHz ~ 1 GHz
EFT:±1 kV
Surge:±4 kV
CS:150 kHz ~ 80 MHz
V-DIP:max 16 A (각 상당) |
소재지 |
| EN 55014-1:2011 |
Electromagnetic compatibility - Requirements for household appliances, electric tools and similar apparatus - Part 1: Emission |
CE:150 kHz ~ 30 MHz
RE:30 MHz ~ 1 GHz
DP:30 MHz ~ 300 MHz |
소재지 |
| EN 55014-2:2015 |
Electromagnetic compatibility - Requirements for household appliances, electric tools and similar apparatus - Part 2: Immunity - Product family standard |
ESD:±8 kV
RS:80 MHz ~ 3 GHz
EFT:±1 kV
Surge:±2 kV
CS:150 kHz ~ 230 MHz
V-DIP:max 16 A (각 상당) |
소재지 |
| EN 60601-1-2:2015 |
Medical electrical equipment - Part 1-2: General |
ESD:±8 kV
RS:80 MHz ~ 3 GHz
EFT:±2 kV
Surge:±2 kV
CS:150 kHz ~ 80 MHz
M/F:3 A/m
V-DIP:max 16 A (각 상당) |
소재지 |
| EN 61000-6-1:2007 |
Electromagnetic compatibility (EMC) - Part 6-1: Generic standards - Immunity for residential, commercial and light-industrial environments |
ESD:±8 kV
RS:80 MHz ~ 6 GHz
EFT:±1 kV
Surge:±2 kV
CS:150 kHz ~ 80 MHz
M/F:3 A/m
V-DIP:max 16 A (각 상당) |
소재지 |
| EN 61000-6-2:2005 |
Electromagnetic compatibility (EMC) - Part 6-2: Generic standards - Immunity for industrial environments |
ESD:±8 kV
RS:80 MHz ~ 6 GHz
EFT:±2 kV
Surge:±2 kV
CS:150 kHz ~ 80 MHz
M/F:3 A/m
V-DIP:max 16 A (각 상당) |
소재지 |
| EN 61000-6-3:2011 |
Electromagnetic compatibility (EMC) - Part 6-3: Generic standards - Emission standard for residential, commercial and light-industrial environments |
CE:150 kHz ~ 30 MHz
RE:30 MHz ~ 6 GHz |
소재지 |
| EN 61000-6-4:2011 |
Electromagnetic compatibility (EMC) - Part 6-4: Generic standards - Emission standard for industrial environments |
CE:150 kHz ~ 30 MHz
RE:30 MHz ~ 6 GHz |
소재지 |
| EN 61000-4-2:2009 |
Electromagnetic compatibility (EMC) - Part 4-2: Testing and measurement techniques - Electrostatic discharge immunity test |
ESD:±8 kV |
소재지 |
| EN 61000-4-3:2006+ A2:2010 |
Electromagnetic compatibility (EMC) - Part 4-3: Testing and measurement techniques - Radiated, radio-frequency, electromagnetic field immunity test |
RS:80 MHz ~ 3 GHz |
소재지 |
| EN 61000-4-4:2012 |
Electromagnetic compatibility (EMC) - Part 4-4: Testing and measurement techniques - Electrical fast transient/burst immunity test |
EFT:±4 kV |
소재지 |
| EN 61000-4-5:2014 +A1:2017 |
Electromagnetic compatibility (EMC). Testing and measurement techniques. Surge immunity test |
Surge:±4 kV |
소재지 |
| EN 61000-4-6:2014 |
Electromagnetic compatibility (EMC). Testing and measurement techniques. Immunity to conducted disturbances, induced by radio-frequency fields |
CS:150 kHz ~ 230 MHz |
소재지 |
| EN 61000-4-8:2010 |
Electromagnetic compatibility (EMC). Testing and measurement techniques. Power frequency magnetic field immunity test |
M/F:125 A/m |
소재지 |
| EN 61000-4-11:2004 |
Electromagnetic compatibility (EMC). Testing and measurement techniques. Voltage dips, short interruptions and voltage variations immunity tests |
V-DIP:max 16 A (각 상당) |
소재지 |
| IEC 60533:2015 |
Electrical and electronic installations in ships – Electromagnetic compatibility (EMC) |
6. RE :150 kHz ~ 2 GHz
CE:10 kHz ~ 30 MHz
7. Conducted radio frequency interference:150 kHz ~ 80 MHz, 3 Vrms
Conducted low frequency interference:AC Power 10 %
AC supply voltage
50 Hz to 900 Hz; 10 % to
1 % 900 Hz to 6 000 Hz;
1 % 6 kHz to 10 kHz,
DC Power;10 % DC supply
voltage
50 Hz to 10 kHz
Power supply variation:
Voltage: ±20 % for 1.5 s
Freq: ±10 % for 5 s
Power supply failure:
100 %, 60 s
EFT:±2 kV
Surge Voltage:±1 kV
Electrostatic discharge:
±6 kV contact and ±8 kV air
Electromagnetic field:
80 MHz ~ 2 GHz, 10 V/m |
소재지 |
| IEC 60945:2002 |
Maritime navigation and radio communication equipment and systems — General requirements —Methods of testing and required test results |
9. CE:10 kHz ~ 30 MHz
RE:150 kHz ~ 2 GHz
10. CS:150 kHz ~ 80 MHz, 10 Vrms
RS:80 MHz ~ 2 GHz, 10 V/m
Bursts:±2 kV
Surges:±1 kV
Power supply short term variation:
±20 % for 1.5 s
±10 % for 5 s
Power supply failure:Interruption:
100 % for 60 s
ESD:±6 kV Contact, ±8 kV Air |
소재지 |
| IEC 61000-4-2:2008 |
Electromagnetic compatibility (EMC) - Part 4-2: Testing and measurement techniques - Electrostatic discharge immunity test |
ESD:±8 kV |
소재지 |
| IEC 61000-4-3:2006 +AMD1: 2007+AMD2:2010 CSV |
Electromagnetic compatibility (EMC) - Part 4-3: Testing and measurement techniques - Radiated, radio-frequency, electromagnetic field immunity test |
RS:80 MHz ~ 3 GHz |
소재지 |
| IEC 61000-4-4:2012RLV |
Electromagnetic compatibility (EMC) - Part 4-4: Testing and measurement techniques - Electrical fast transient/burst immunity test |
EFT:±4 kV |
소재지 |
| IEC 61000-4-5:2014+ AMD1:2017 CSV |
Electromagnetic compatibility (EMC) - Part 4-5: Testing and measurement techniques - Surge immunity test |
Surge:±4 kV |
소재지 |
| IEC 61000-4-6: 2013 |
Electromagnetic compatibility (EMC) - Part 4-6: Testing and measurement techniques - Immunity to conducted disturbances, induced by radio- frequency fields |
CS:150 kHz ~ 230 MHz |
소재지 |
| IEC 61000-4-8:2009 |
Electromagnetic compatibility (EMC) - Part 4-8: Testing and measurement techniques - Power frequency magnetic field immunity test |
M/F:125 A/m |
소재지 |
| IEC 61000-4-11:2004 |
Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests |
V-DIP:max 16 A (각 상당) |
소재지 |
| MIL-STD-188-125-1:2005 |
High-AltitudeElectromagnetic Puse(HEMP) protection for ground-based C4I facilities performing critical time-urgent missions Part 1 Fixed facilities |
SE:10 kHz ~ 1 GHz
PCI:Short pulse (5 kA),
Intermediate pulse (250 A) |
소재지 |
| MIL-STD-188-125-2:1999(Notice 1:2005) |
High-Altitude Electromagnetic Pulse(HEMP) protection for ground-based C4I facilities performing critical time-urgent missions Part 2 TRANSPORTABLE SYSTEMS |
SE:10 kHz ~ 1 GHz
PCI:Short Pulse (5 kA),
Intermediate pulse (250 A) |
소재지 |
| MIL-STD-220C:2009 |
DEPARTMENT OF DEFENSE Test method standard - Method of insertion loss measurement |
max. 10 GHz |
소재지 |
| MIL-STD-461D:1993 |
Department of Defense Interface Standard Requirements for the control of electromagnetic interference emissions and susceptibility
5.3.1 CE101 (Conducted emissions, power leads 30 Hz to 10 kHz)
5.3.2 CE102 (Conducted emissions power leads 10 kHz to 10 MHz)
5.3.3 CE106 (Conducted emissions, antenna terminal 10 kHz to 40 GHz)
5.3.4 CS101 (Conducted susceptibility, power leads 30 Hz to 50 kHz)
5.3.5 CS103 (Conducted susceptibility, antenna port, intermodulation 15 kHz to 10 GHz)
5.3.6 CS104 (Conducted susceptibility, antenna port, rejection of undesired signals 30 Hz to 20 GHz)
5.3.9 CS114 (Conducted susceptibility, bulk cable injection 10 kHz to 400 MHz)
5.3.10 CS115 (Conducted susceptibility, bulk cabie injection, impulse excitation)
5.3.11 CS116 (Conducted susceptibility, damped sinusoidal transients, cables and power leads 10 kHz to 100 MHz)
5.3.12 RE101 (Radiated emissions, magnetic field 30 Hz to 100 kHz)
5.3.13 RE102 (Radiated emissions, electric field 10 kHz to 18 GHz
5.3.15 RS101 (Radiated susceptibility, magnetic field 30 Hz to 100 kHz)
5.3.16 RS103 (Radiated susceptibility, electric field 10 kHz to 40 GHz) |
5.3.1 30 Hz to 10 kHz
5.3.2 10 kHz to 10 MH
5.3.3 10 kHz to 40 GHz
5.3.4 30 Hz to 50 kHz
5.3.5 15 kHz to 10 GHz
5.3.6 30 Hz to 20 GHz
5.3.9 10 kHz to 400 MHz
5.3.10 30 Hz, 10 A
5.3.11 10 kHz to 100 MHz, 1 MHz, 10 MHz, 30 MHz, 100 MHz
5.3.12 30 Hz to 100 kHz
5.3.13 10 kHz to 18 GHz
5.3.15 30 Hz to 100 kHz
5.3.16 2 kHz to 18 GHz, Max : 50 V/m
5.3.16 RS103 Frequency above 18 GHz |
소재지 |
| MIL-STD-461E:1999 |
REQUIREMENTS FOR THE CONTROL OF ELECTROMAGNETIC INTERFERENCE CHARACTERISTICS OF SUBSYSTEMS AND EQUIPMENT
5.4 CE101, conducted emissions, power leads, 30 Hz to 10 kHz
5.5 CE102, conducted emissions, power leads, 10 kHz to 10 MHz
5.6 CE106, conducted emissions, antenna terminal, 10 kHz to 40 GHz
5.7 CS101, conducted susceptibility, power leads, 30 Hz to 150 kHz
5.8 CS103, conducted susceptibility, antenna port, intermodulation, 15 kHz to 10 GHz
5.9 CS104, conducted susceptibility, antenna port, rejection of undesired signals, 30 Hz to 20 GHz
5.12 CS114, conducted susceptibility, bulk cable injection, 10 kHz to 200 MHz
5.13 CS115, conducted susceptibility, bulk cable injection, impulse excitation
5.14 CS116, conducted susceptibility, damped sinusoidal transients, cables and power leads, 10 kHz to 100 MHz
5.15 RE101, Radiated emissions, magnetic field, 30 Hz to 100 kHz
5.16 RE102, radiated emissions, electric field, 10 kHz to 18 GHz
5.18 RS101, radiated susceptibility, magnetic field, 30 Hz to 100 kHz
5.19 RS103, radiated susceptibility, electric field, 2 MHz to 40 GHz |
5.4 30 Hz to 10 kHz
5.5 10 kHz to 10 MHz
5.6 10 kHz to 40 GHz
5.7 30 Hz to 150 kHz
5.8 15 kHz to 10 GHz
5.9 30 Hz to 20 GHz
5.12 10 kHz to 200 MHz
5.13 30 Hz rate. 10 A
5.14 10 kHz to 100 MHz, 1 MHz, 10 MHz, 30 MHz, 100MHz
5.15 30 Hz to 100 kHz
5.16 10 kHz to 18 GHz
5.18 30 Hz to 100 kHz
5.19 2 MHz to 18 GHz, Max : 50 V/m
5.19 RS103 Frequency above 18 GHz |
소재지 |
| MIL-STD-461F:2007 |
REQUIREMENTS FOR THE CONTROL OF ELECTRO MAG NETIC INTERFERENCE CHARACTERISTICS OF SUBSYSTEMS AND EQUIPMENT
5.4 CE101, conducted emissions, power leads, 30 Hz to 10 kHz
5.5 CE102, conducted emissions, power leads, 10 kHz to 10 MHz
5.6 CE106, conducted emissions, antenna terminal, 10 kHz to 40 GHz
5.7 CS101, conducted susceptibility, power leads, 30 Hz to 150 kHz
5.8 CS103, conducted susceptibility, antenna port, intermodulation, 15 kHz to 10 GHz
5.9 CS104, conducted susceptibility, antenna port, rejection of undesired signals, 30 Hz to 20 GHz
5.11 CS106, conducted susceptibility, transients, power lead
5.13 CS114, conducted susceptibility, bulk cable injection, 10 kHz to 200 MHz
5.14 CS115, Conducted susceptibility, bulk cable injection, impulse excitation
5.15 CS116, conducted susceptibility, damped sinusoidal transients, cables and power leads, 10 kHz to 100 MHz
5.16 RE101, radiated emissions, magnetic field, 30 Hz to 100 kHz
5.17 RE102, radiated emissions, electric field, 10 kHz to 18 GHz
5.19 RS101, radiated susceptibility, magnetic field, 30 Hz to 100 kHz
5.20 RS103, radiated susceptibility, electric field, 2 MHz to 40 GHz |
5.4 30 Hz to 10 kHz
5.5 10 kHz to 10 MHz
5.6 10 kHz to 40 GHz
5.7 30 Hz to 150 kHz
5.8 15 kHz to 10 GHz
5.9 30 Hz to 20 GHz
5.11 400 V
5.13 10 kHz to 200 MHz
5.14 30 Hz, 10 A
5.15 10 kHz to 100 MHz, 1 MHz, 10 MHz, 30 MHz, 100 MHz
5.16 30 Hz to 100 kHz
5.17 10 kHz to 18 GHz
5.19 30 Hz to 100 kHz
5.20 2 MHz to 18 GHz, Max : 50 V/m
5.20 RS103 Frequency above 18 GHz |
소재지 |
| MIL-STD-461G:2015 |
REQUIREMENTS FOR THE CONTROL OF ELECTROMAGNETIC INTERFERENCE CHARACTERISTICS OF SUBSYSTEMS AND EQUIPMENT
5.4 CE101, conducted emissions, power leads
5.5 CE102, conducted emissions, power leads
5.6 CE106, conducted emissions, antenna terminal
5.7 CS101, conducted susceptibility, power leads
5.8 CS103, conducted susceptibility, antenna port, intermodulation
5.9 CS104, conducted susceptibility, antenna port, rejection of undesired signals
5.11 CS109, conducted susceptibility, structure current
5.12 CS114, conducted susceptibility, bulk cable injection
5.13 CS115, conducted susceptibility, bulk cable injection, impulse excitation
5.14 CS116, conducted susceptibility, damped sinusoidal transients, cables and power leads
5.16 CS118, personnel borne electrostatic discharge
5.17 RE101, radiated emissions, magnetic field
5.18 RE102, radiated emissions, electric field
5.20 RS101, radiated susceptibility, magnetic fiel
5.21 RS103, radiated susceptibility, electric field, |
5.4 30 Hz to 10 kHz
5.5 10 kHz to 10 MHz
5.6 10 kHz to 40 GHz
5.7 30 Hz to 150 kHz, Max : 136 dBμV
5.8 15 kHz to 10 GHz
5.9 30 Hz to 20 GHz
5.11 60 Hz to 100 kHz, Max : 126 dBμA
5.12 4 kHz to 200 MHz, Max : 109 dBμA
5.13 30 Hz, 5 A
5.14 10 kHz to 100 MHz, Max : 10 A
5.16 Max : Contact ± 8 kV, Air ± 15 kV
5.17 30 Hz to 100 kHz
5.18 10 kHz to 18 GHz
5.20 30 Hz to 100 kHz, Max : 180 dBpT
5.21 2 MHz to 18 GHz, Max : 50 V/m
5.21 RS103 Frequency above 18 GHz |
소재지 |
| IEEE STD 299:2006 |
IEEE Standard Method for measuring the Effectiveness of Electromagnetic Shielding Enclosures |
SE:9 kHz ~ 18 GHz |
소재지 |
| MIL-STD-464C:2010 |
ELECTROMAGNETIC ENVIRONMENTAL EFFECTS REQUIREMENTS FOR SYSTEM
5.1 Margins
5.2 Intra-system electromagnetic compatibility (EMC)
5.2.1 Hull generated intermodulation interference(IMI)
5.2.2 Shipborad internal electromagnetic environment(EME)
5.6 Electromagnetic pulse(EMP)
5.7 Subsystems and equipment electromagnetic interference(EMI)
5.8 Electrostatic charge control.
5.8.3 Ordnance subsystems
5.9 Electromagnetic radiation hazards (EMRADHAZ)
5.9.1 Hazards of electromagnetic radiation to personnel (HERP)
5.11 Electrical bonding
5.12 External grounds
5.1 EIDs : 16.5 dB 5.6 MIL-STD-2169 |
5.1 safety critical & mission critical:6 dB
5.2.1 10 kHz ~ 18 GHz
5.2.2 10 kHz ~ 18 GHz
5.6 SE : 10 kHz ~ 1 GHz , PCI : Short Pulse (5 kA), Intermediate Pulse (250 A)
5.7 30 Hz ~ 18 GHz
5.8.3 Contact discharge ± 8 kV, Air discharge ± 15 kV
5.9.1 10 kHz ~ 18 GHz
5.11 Min 0.01 mΩ
5.12 Min 0.01 mΩ |
소재지 |
| IACS:(Rev.8) 2022 |
E10 Test Specification For Type Approval
3. External power supply failure
4. Power supply variations
13. Electrostatic discharge
14. Electromagnetic field
15. Conducted low Frequency
16. Conducted Radio Frequency
17. Burst/Fast Transients
18. Surge/voltage
19. Radiated Emission
20. Conducted Emission |
3. Interruption for 5 minutes, switching-off for 30 s
4. Voltage : ±20 %, Freq : ±10 %
13. Contact discharge: ± 6kV Air discharge: ± 2kV, ± 4kV, ± 8kV
14. RS :80 MHz ~ 2 GHz, 10 V/m
15. DC~ 12 kHz, 3 Vrms
16. CS :150 kHz ~ 80 MHz, 3 Vrms
17. Bust : ±2 kV
18. Surge/Voltage : ±1 kV
19. RE : 150 kHz ~ 2 GHz
20. CE : 10 kHz ~ 30 MHz |
소재지 |
| KS C IEC 60533:2003 |
선박용 전기설비-전자기 적합성 |
6. RE :150 kHz ~ 2 GHz
CE:10 kHz ~ 30 MHz
7. Conducted radio frequency interference:150 kHz ~ 80 MHz, 3 Vrms
Conducted low frequency interference:AC Power 10 %
AC supply voltage
50 Hz to 900 Hz; 10 % to
1 % 900 Hz to 6 000 Hz;
1 % 6 kHz to 10 kHz,
DC Power;10 % DC supply
voltage
50 Hz to 10 kHz
Power supply variation:
Voltage: ±20 % for 1.5 s
Freq: ±10 % for 5 s
Power supply failure:
100 %, 60 s
EFT:±2 kV
Surge Voltage:±1 kV
Electrostatic discharge:
±6 kV contact and ±8 kV air
Electromagnetic field:
80 MHz ~ 2 GHz, 10 V/m |
소재지 |
